Table-Top Instrument For 3D Light Scatter Measurements

Fraunhofer

Diffraction Grating

Diffraction Grating

Gemstone

Gemstone

Thin Film Coating

Thin Film Coating

3D scattering distributions measured at 532 nm

PDF iconDownload the Table-Top Instrument Data Sheet

System description

The new Table-Top 3D Scatterometer TTS, developed at the Fraunhofer Institute (IOF) in Jena, Germany, enables laser-based highly sensitive measurements of angle resolved light scattering, reflectance, and transmittance of optical and non-optical surfaces, materials and components within the entire 3D-sphere.

Applications

Characterization of surfaces, coatings, and materials:

  • Quality control, appearance
  • Optical performance
  • Roughness analysis

Specifications

  • Measurement of Angle Resolved Light Scattering (BRDF, BTDF), Reflectance, and Transmittance
  • Full 3D-spherical measurement capability
  • In- and out-of-plane modes
  • Flexible variation of incident angle, scattering angle (azimuthal and polar angles), and polarization
  • Area raster scans of sample surface
  • Housed table top system < 1 m³
  • Dynamic range: 13 orders of magnitude
  • Instrument signature down to ARS: 3×10-08 sr-1
  • Roughness equivalent sensitivity: < 0.1 nm
  • Wavelength: 532 nm (other wavelengths on demand, e.g. 375 nm, 405 nm, 637 nm)
  • User-friendly software for measurement control and data analysis
  • Analysis tools: Roughness, PSD, Total / Integrated Scatter (scatter loss)
Examples of in-plane scattering distributions of optical components measured at 532 nm.

Examples of in-plane scattering distributions of optical components measured at 532 nm.

Superposition of 3D scattering distributions of gemstone at 405 nm, 532 nm, and 640 nm.

Superposition of 3D scattering distributions of gemstone at 405 nm, 532 nm, and 640 nm.

 
 
PDF iconContact us for current pricing and availability